2025-08-30 06:21 |
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2025-08-30 06:21 |
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2025-08-30 06:21 |
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Imperfections and Corrections
/ Ziemann, V (Uppsala U.)
After a review of linear imperfections and their causes, we discuss how to model them, the diagnostic equipment needed to monitor them, and the correction algorithms to fix the problem they cause. [...]
arXiv:2006.11016.
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2020 - 20.
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2025-08-30 06:21 |
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2025-08-30 06:21 |
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Secondary Ion Beams
/ Knie, Klaus (Darmstadt, GSI)
Secondary ion beams are beams of particles produced by bombarding a production target with a primary beam of a stable nuclide (in most cases protons) or by fragmentation of heavy primary particles. [...]
arXiv:2103.08950.
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2021 - 10.
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2025-08-30 06:21 |
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2025-08-30 06:21 |
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2025-08-30 06:21 |
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2025-08-30 06:21 |
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